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A new metric is proposed to improve the fidelity of structures refined against precession electron diffraction data. The inherent dynamical nature of electron diffraction ensures that direct refinement of recorded intensities against structure-factor amplitudes can be prone to systematic errors. Here it is shown that the relative intensity of precessed reflections, their rank, can be used as an alternative metric for refinement. Experimental data from erbium pyrogermanate show that applying precession reduces the dynamical transfer of intensity between reflections and hence stabilizes their rank, enabling accurate and reliable structural refinements. This approach is then applied successfully to an unknown structure of an oxygen-deficient bismuth manganite resulting in a refined structural model that is similar to a calcium analogue.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S0108767312007234/td5007sup1.cif
Contains datablock I

Computing details top

Tribismuth dimanganate(IV) top
Crystal data top
Bi3Mn2O7β = 90°
Mr = ?γ = 90°
?, Cmc21V = 504.50 Å3
a = 16.8 (1) ÅZ = 4.0
b = 5.51 (1) Å? radiation, λ = ? Å
c = 5.45 (1) Å × × mm
α = 90°
Data collection top
h = ??l = ??
k = ??
Refinement top
Crystal data top
Bi3Mn2O7β = 90°
Mr = ?γ = 90°
?, Cmc21V = 504.50 Å3
a = 16.8 (1) ÅZ = 4.0
b = 5.51 (1) Å? radiation, λ = ? Å
c = 5.45 (1) Å × × mm
α = 90°
Data collection top
Refinement top
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzBiso*/Beq
Bi10.000.220.03
Bi20.180.740.48
Mn10.100.240.50
O10.000.760.98
O20.210.780.03
O30.100.500.27
O40.090.050.23

Experimental details

Crystal data
Chemical formulaBi3Mn2O7
Mr?
Crystal system, space group?, Cmc21
Temperature (K)?
a, b, c (Å)16.8 (1), 5.51 (1), 5.45 (1)
α, β, γ (°)90, 90, 90
V3)504.50
Z4.0
Radiation type?, λ = ? Å
µ (mm1)?
Crystal size (mm) × ×
Data collection
Diffractometer?
Absorption correction?
No. of measured, independent and
observed (?) reflections
?, ?, ?
Rint?
Refinement
R[F2 > 2σ(F2)], wR(F2), S ?, ?, ?
No. of reflections?
No. of parameters?
No. of restraints?
Δρmax, Δρmin (e Å3)?, ?

 

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